- near-field scanning
- Телекоммуникации: поточечное измерение показателя преломления (оптоволокна)
Универсальный англо-русский словарь. Академик.ру. 2011.
near-field scanning
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Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… … Wikipedia
Near-field optics — is that branch of optics that considers configurations that depend on the passage of light to, from, through, or near an element with subwavelength features and the coupling of that light to a second element located a subwavelength distance from… … Wikipedia
Near-field scanner — Electromagnetic near field scanner could be defined as a measurement system to determine a spatial distribution of an electrical quantity provided by a single or multiple field probes acquired in the near field region of a device under test… … Wikipedia
Electromagnetic near-field scanner — could be defined as a measurement system to determine a spatial distribution of an electrical quantity provided by a single or multiple field probes acquired in the near field region of a device under test possibly accompanied by the associated… … Wikipedia
Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… … Wikipedia
Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface … Wikipedia
Scanning probe microscopy — Part of a series of articles on Nanotechnology … Wikipedia
Scanning tunneling spectroscopy — (STS) is a powerful experimental technique in scanning tunneling microscopy (STM) that uses a scanning tunneling microscope (STM) to probe the local density of electronic states (LDOS) and band gap of surfaces and materials on surfaces at the… … Wikipedia
Feature-oriented scanning — (FOS)[1][2][3] is a method intended for high precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the… … Wikipedia
Counter-scanning — (CS)[1] is a method for measuring surface topography with a scanning probe microscope enabling correction of raster distortions resulted from drift of the microscope probe relative to the surface being measured. Two surface scans, viz. direct… … Wikipedia
Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs … Wikipedia
